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Hewlett-Packard Application Notes

 

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The listing gives the following information:

  • AN-Nbr - The original numerical classification made by HP.
  • DATE - When their is one appearing somewhere in the application note.
  • Related Instr - The instrument for which the application note has been edited (if any). Or the
    instrument typical of the AN subject. XX number completion is frequently used and
    the "++" notation stand for "reference to the overall product line of the instrument listed"
  • TITLE - The exact title and sub-title if any of the application note.

 



Application Notes
AN Number DATE Related Instr TITLE
AN-300 1980 89XX-HP85 High Performance Semi-Automatic Transceiver Testing
AN-301-1 1980 10544-10811 Low Noise Division of 10 MHz Oscillators
AN-302-1 1980 4191A Direct Radio Frequency Impedance Measurements Using the 4191A RF Impedance Analyzer
AN-302-2 1981 4191A Impedance Characterization of High Q Devices from 1MHz to 1000MHz with 1Hz Resolution Using the 4191A RF Impedance Analyzer
AN-308-1 1980 3060A Dynamic Digital Board Testing with the HP Model 3060A Option 100
AN-309-1 1981 3060A Static Digital Testing Using the HP 3060A Board Test System
AN-309-2 1981 3060A Networking your Computer to the HP 3060A Board Test System
AN-311 1981 - Economics of IC Testing at Incoming Inspection
AN-312-1 1981 8350-8709 Configuration of a Two-Tone Sweeping Generator 8350A/8620C Sweep Oscillators
AN-313-1 ? 5180A Troubleshooting Microprocessor-Based Systems Using the 5180A Waveform Recorder and a Logic Analyzer
AN-313-2 ? 5180A-85XX Teaming Up a 5180A Waveform Recorder and a Spectrum Analyzer for New Time-Domain Measurement Capabilities
AN-313-3 ? 5180A Using the 5180A Waveform Recorder to Measure Microwave VCO Settling Time and Post Tuning Drift
AN-313-4 ? 5180A-5359A Extending Frequency Range and Increasing Effective Sample Rate on the 5180A Waveform Recorder
AN-313-5 ? 5180A Power Supply Testing with the 5180A Waveform Recorder
AN-313-6 ? 5180A-5359A Recording Sonar and Other Signals Using the 5180A's Toggle Mode
AN-313-7 ? 5180A-3325A Interconnecting Two or More 5180A Waveform Recorders to Obtain Multiple Input Channels
AN-313-8 ? 5180A-9826 Using the Direct Memory Access Capability of the 5180A Waveform Recorder with the 9826 Desktop Computer
AN-313-9 ? 5180A-8112A Using the 5180A Waveform Recorder to Evaluate Floppy Disc Media and Drive Electronics
AN-313-10 1988 5185A-5185T HP 5181A Waveform Recorder - HP 5185T Digitizing Oscilloscope - Radar System Characterization and Testing
AN-313-11 1988 5185T Using Digital Filtering Techniques to Improve Analog-to-Digital Converter Measurements
AN-314 1981 1741A Variable-Persistence Aids Signal Display (Reprint from EDN Magazine)
AN-314-1 1986 8770S Receiver Testing with the 8770S Arbitrary Waveform Synthesizer System
AN-314-2 1986 8770S Synthesizing Magnetic Disc Read and Servo Signals with the HP 8770S Arbitrary Waveform Synthesizer System
AN-314-3 1986 8770S Television Signal Simulation with the HP 8770S Arbitrary Waveform Synthesizer System
AN-314-4 1987 8770A-8780A Exceptionally-Complex Signal Simulation for Multi-Signal Environments in Radar/EW Test
AN-314-5 ? 8780A-8791 A Guide to Microwave Upconversion
AN-315 1985 4145A DC Parametric Analysis of Semiconductor Devices
AN-315 1992 4145B Practical Applications of the HP 4145B Semiconductor Parameter Analyzer - DC Parametric Analysis of Semiconductor Devices
AN-316-3 1982 6942A High Speed FET Scanning with the 6942A Multiprogrammer
AN-317 1982 4193A-9845B Practical Design and Evaluation of High Frequency Circuits Using the HP 4193A Vector Impedance Meter
AN-319 1982 818X Parametric Characterization of Digital Circuits Up to 50 MHz
AN-322 1983 4280A Analysis of Semiconductor Capacitance Characteristics Using the HP 4280A 1MHz C Meter / C-V Plotter
AN-323 1983 3746A Detection of High Level Signals in FDM Networks
AN-324-1 1983 445XX Understanding Your Bed-of-Nails Test Fixture
AN-325-2 ? 5528A Machine Tool Calibration - Laser Measurement System 5528A - HP85
AN-325-12 1990 5517B-10705A Non-Contact Measurements with Laser Interferometers
AN-326 1986 - Principles of Microwave Connector Care (For Higher Reliability and Better Measurements)
AN-328-1 1983 3488A ++ Practical Test System Signal Switching
AN-329 1983 86XX-83XX Performance Characteristics of HP Microwave Signal Sources - A Comparison
AN-329 1986 86XX-83XX Microwave Signal Sources Spectral Purity Characteristics of HP Microwave Signal Sources
AN-330-1 1985 8566-9836 Automatic MIL-STD EMI Testing Using the HP 85864A/B EMI Measurement Software
AN-331-1 1986 8566-85650A Automatic CISPR EMI Testing For Conductef Emissions Using the HP 85864A/B EMI Measurement Software
AN-332 1984 11713A-333XX Microwave Switching From SPDT to Full Access Matrix
AN-332-1 1987 11713A-333XX Novel combinations of microwave switches and step attenuators for programming applications
AN-333 1984 3054A Monitoring of a Solar Collector and Heat Reclamation Heating System
AN-334 1984 4063A Automation of Semiconductor Parameter Analysis - Practical Applications of the HP 4063A Semiconductor Parameter Analysis System
AN-339 1985 4194A Parametric Analysis for Electronic Components and Circuit Evaluation Using the 4194A Impedance / Gain-Phase Analyzer
AN-339-1 1985 4194A Impedance Characterisation of Resonators Using the 4194A Impedance / Gain-Phase Analyzer
AN-339-2 1986 4194A Characteristic Impedance Measurement of PC Board Circuit Patterns - HP 4194A Application Information
AN-339-3 1986 4194A Crosstalk and Impedance Measurements of PC Board Patterns - HP 4194A Application Information
AN-339-4 1986 4194A Measuring the Characteristic Impedance of Balanced Cables - HP 4194A Application Information
AN-339-5 1986 4194A Multi-Frequency C-V Measurements and Doping Profile Analysis of Semiconductors - HP 4194A Application Information
AN-339-6 ? 4194A Static Head Testing of Disk Drives - HP 4194A Application Information
AN-339-7 1987 4194A Efficient Evaluation of LISNs and Voltage Probes for EMI Tests - HP 4194A Impedance / Gain-Phase Analyzer
AN-339-8 1987 4194A Constant Current Measurements Using the HP 4194A - HP 4194A Impedance / Gain-Phase Analyzer
AN-339-9 1987 4194A Negative Impedance Measurements of Crystal Oscillators - HP 4194A Impedance / Gain-Phase Analyzer
AN-339-10 1987 4194A Input / Output and Reflection Coefficient Measurements - HP 4194A Impedance / Gain-Phase Analyzer
AN-339-11 1987 4194A Filter Test for Production and Incoming Inspection - HP 4194A Impedance / Gain-Phase Analyzer
AN-339-13 1987 4194A Measuring the dielectric Constant of Solid Materials - HP 4194A Impedance / Gain-Phase Analyzer
AN-339-14 1988 4194A Testing Switching Power Supplies Using the HP 4194A
AN-339-20 1987 414X Role of DC Parametric Test in High Speed Digital and Microwave Semiconductor Component Manufacturing
AN-340-1 1990 - Reducing Fixture-Induced Test Failures
AN-341-1 ? 1630G-8175A Testing a Complex LSI / VLSI IC with a Low-Cost Measurement Set-UP
AN-341-2 ? 8175A Simulating Sensor Signals - Calibrating and Testing an IR Detecting System with the HP 8175A
AN-343-1 1986 8780A-8980A Vector Modulation Measurements - Measurement Applications for Digital Microwave Radio
AN-343-2 1988 8780A-8981A Dynamic Component Test Using Vector Modulation Analysis
AN-343-3 1986 8780A-8980A Vector Modulation Measurements - Coherent Pulsed Tests of Radar and Electronic Warfare Systems
AN-343-4 1987 8980A Measuring Demodulator Image Rejection Using the HP 8980A Vector Analyzer
AN-343-5 1988 8780A-8770A Calibrated Microwave System for Complex Arbitrary Signal Simulation Using HP 8780A and HP 8770A Arbitrary Waveform Synthesizer
AN-343-6 1989 878X-3708A Testing Digital Microwave Receivers Using a Calibrated Source
AN-344 1986 54100A-D Bandwidth and Sampling Rate in Digitizing Oscilloscopes
AN-345-1 1986 8757A ++ Amplifier Measurements Using the Scalar Network Analyzer
AN-345-1 2001 8757A ++ Microwave Component Measurements - Amplifier Measurements Using the Scalar Network Analyzer
AN-345-2 1987 8757A ++ Mixer Measurements Using the Scalar Network Analyzer
AN-346 1986 41XX-42XX A Guideline for Designing External DC Bias Circuits for the HP 4192A, 4194A, 4274A, 4275A, 4276A, 4277A
AN-346-2 1992 4194A-4195A Balanced Circuit Measurement wth an Impedance Meter / LCR Meter / Network Analyzer
AN-346-3 1992 4285A Effective Impedance Measurement Using OPEN / SHORT / LOAD Correction
AN-346-4 1999 42XX 8 Hints for Successful Impedance Measurements
AN-348 1986 - Voltage and Time Resolution in Digitizing Oscilloscopes
AN-349 1986 - PC Instruments Applications Handbook - Explore Ways to Improve Your Test and Measurement Productivity
AN-351 1987 8753A Characterization of High-Speed Optical Components with an RF Network Analyzer
AN-355A 1992 37XX Digital Radio Theory and Measurements
AN-355-1 1992 37XX-8590A A Description of the Wide Range of Test Solutions Available From HP for Digital Radio Test
AN-356 1987 4142B-S300 HP 4142B Modular DC Source / Monitor Practical Applications - High Speed DC Characterisation of Semiconductor Devices Sub pA to 1A
AN-356-1 1988 4142B-S300 HP 4142B Modular DC Source / Monitor Practical Applications - Techniques and Applications for High Throughput and Stable Characterization
AN-357-3 1988 4195A Advanced Filter Evaluation and Limit Testing with HP 4195A Network / Spectrum Analyzer
AN-357-4 1989 4195A Testing Magnetic Disk Read Circuits Using the HP 4195A
AN-358-1 1987 5371A HP 5371A Frequency and Time Interval Analyzer - Characterization of Frequency-Agile Signal Sources
AN-358-2 1987 5371A HP 5371A Frequency and Time Interval Analyzer - Jitter and Wander Analysis in Digital Communications
AN-358-3 1988 5371A HP 5371A Frequency and Time Interval Analyzer - Time Domain Characterization of Magnetic Disk Drives
AN-358-4 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Pre-Trigger Simplifies VCO Step Response Measurements
AN-358-5 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Clock Rate Independent Jitter Measurements for Digital Communications Systems
AN-358-5 1990 5372A Mesure de Gigue Indépendante de la Vitesse d'Horloge pour les Systèmes de Transmission Numériques (French Translation of AN 358-5)
AN-358-6 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Transient Timing Errors in Disk and Tape Drives
AN-358-7 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Analysing Phase-Locked Loop Transients in the Modulation Domain
AN-358-8 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Single Shot BPSK Signal Characterization
AN-358-9 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Modulation Domain Techniques for Measuring Complex Radar Signals
AN-358-9 1991 5372A Technique de Mesure de Signaux Radar Complexes dans le Domaine de Modulation (French Translation of AN 358-9)
AN-358-10 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Baker Coded Modulation in Radar Systems
AN-358-11 1989 5372A HP 5372A Frequency and Time Interval Analyzer - Characterizing Shirp Coded Modulation in Radar Systems
AN-358-12 1990 5371A-5372A Simplify Freqency Stability Measurement with Built-in Allan Variance Analysis
AN-358-12 1990 5371A-5372A Simplifiez les Mesures de Stabilité en Fréquence à l'Aide de l'Analyse de Variance d'Allan Intégrée (French Translation of AN 358-12)
AN-358-13 1990 5372A Analysing Phase-Locked Loop Capture and Tracking Range
AN-360 1987 378X Jitter Tolerance Testing Using Phase or Frequency Modulated Sources and Bit Error Rate Test Sets
AN-361 1988 815X Traceability of Optical Power Measurements - How Traceability to National Standards is Provided by Hewlett-Packard
AN-362 1988 815X-3764A Bit Error Rate Measurements on Optical Fiber Systems
AN-364-2 1990 3709B Digital Radio Testing with British Telecom
AN-366-1 1986 815X-8145A How to Measure Insertion Loss of Optical Components
AN-366-2 1988 815X How to Measure Return Loss of Optical Components
AN-366-3 1988 8145A How to Measure Return Loss in Optical Links Using the HP 8145A OTDR
AN-369-1 1998 4284A Optimizing Electronic Component and Material Impedance Measurements Taking Full Advantage of the HP 4284A Precision LCR Meter
AN-369-2 1988 4284A Tantalum Electrolytic Capacitor Measurements in Production and Quality Control Departments - HP 4284A Precision LCR Meter
AN-369-3 1988 4284A Impedance Measurements of Magnetic Heads Using Constant Current in Production and Quality Control Departments
AN-369-4 1988 4284A Recommending Electronic Manufacturers to Perform Incomming Inspection - HP 4284A Precision LCR Meter
AN-369-5 1998 4284A Multi-Frequency C-V Measurements of Semiconductors - HP 4284A Precision LCR Meter
AN-369-6 1988 4284A Impedance Testing Using Scanner - HP 4284A Precision LCR Meter
AN-369-7 1998 4284A Measurement of Capacitance Characteristics of Liquid Crystal Cell with HP 4284A Precision LCR Meter
AN-369-8 1998 4284A-42841A Wide Range DC Current Biased Inductance Measurement with HP 4284A Precision LCR Meter / HP 42841A Bias Current Source
AN-369-9 1989 4284A-4285A Improve Electronic Product Quality and Performance with HP Precision LCR Meters - HP 4284A and HP 4285A Precision LCR Meters
AN-371 1992 71400 HP 71400 Lightwave Signal Analyzer - Measuring Modulated Light
AN-372-1 1988 60XX Power Supply Testing
AN-372-2 1988 60XX Battery Testing
AN-372-3 1988 60XX-66XX Power Components Testing
AN-374-1 1988 8510B-8340B Antenna Measurements - Manual Pattern Measurements Using the HP 8510B
AN-376-1 1988 662X Biasing Three-Terminal Devices for Test - A precise Solution for Component Evaluation and Sub-Assembly Testing…
AN-377-1 1989 5361A Automatic Frequency Profiling of Chirped Radar Pulses Using the HP 5361A 20 GHz Pulse / CW Microwave Counter
AN-377-2 1989 5361A Automatic Characterization of Microwave VCO's Using the HP 5361A 20 GHz Pulse / CW Microwave Counter
AN-377-3 1989 5361A Frequency Profiling Without a Pulse Generator Using the HP 5361A 20 GHz Pulse / CW Microwave Counter's Built-In Profiling
AN-377-4 1990 5361B Frequency and Phase Profiling Simplified with the HP 5361B Pulse / CW Microwave Counter
AN-378-1 1989 3585B Harmonic Distortion Measurements - Enhancing Speed and Performance with Spectrum Analysis
AN-379-1 1989 11757A Measuring Digital Microwave Radio M-Curves / Signatures
AN-379-2 1990 11758T Measuring Microwave Radio Antenna Return Loss Using the HP 11758T Digital Radio Test System
AN-380-1 1989 16451B Dielectric Constant Measurement of Solid Materials Using the HP 16451B Dielectric Test Fixture
AN-380-2 1990 4195A-4284A Measuring Cable Parameters - HP Precision LCR Meters and Impedance Analyzers
AN-380-3 1995 - Evalution of Colloids by Dielectric Spectroscopy
AN-381 1989 5412X-8131A A Test Setup for Characterizing High-Speed Logic Devices
AN-381 1990 5412X-8131A Configuration de Test pour la Caractérisation des Composants Logiques rapides (French Translation of AN 381)
AN-381-1 1990 5412X-8131A Configuration de Test pour la Caractérisation d'un Trigger de Schmitt rapide (French Translation of AN 381-1)
AN-383-1 1989 4142B Simplification of DC Characterization and Analysis of Semiconductor Devices
AN-383-2 1990 4142B Automation of DC Characterization and Analysis of Semiconductor Devices
AN-385 1989 3048A Millimeter Measurements Using the HP 3048A Phase Noise Measurement System
AN-386 1990 3048A Pulsed Carrier Phase Noise Measurements Using the HP 3048A Phase Noise Measurement System
AN-387 1990 378X-37721A High Productivity Measurements in Digital Transmission
AN-388 1990 - Signal Generator Spectral Purity
AN-392-1 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Aerospace and Defense Applications
AN-392-2 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - PC and PC Add-On Applications
AN-392-3 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - VME / VXI Applications
AN-392-4 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Workstation / Server Applications
AN-392-5 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Computer Peripheral Applications
AN-392-6 1990 165XX How the Right Preprocessor Interface Can Simplify Logic Analysis - Industrial / Automotive Applications
AN-393 1990 3562A Monitoring of Ultrasonic Wire Bonding Machines
AN-397-1 1990 4951X-4952A ISDN Testing Techniques for the HP 4954I and the HP 4951C / HP 4952A WAN Protocol Analyzers
AN-398-2 1990 - Correlation of Timing Measurements
AN-399 1990 4972A Problem Isolation Techniques for Ethernet 802.3 Local Area Networks

 

 

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