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Hewlett-Packard Application Notes

 

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The listing gives the following information:

  • AN-Nbr - The original numerical classification made by HP.
  • DATE - When their is one appearing somewhere in the application note.
  • Related Instr - The instrument for which the application note has been edited (if any). Or the
    instrument typical of the AN subject. XX number completion is frequently used and
    the "++" notation stand for "reference to the overall product line of the instrument listed"
  • TITLE - The exact title and sub-title if any of the application note.

 



Application Notes
AN Number DATE Related Instr TITLE
AN-401-3 1979 HP1000-5345A 5345A Electronic Counter HP-IB/HP 1000 Programming Example
AN-401-4 1979 HP1000-5342A 5342A Microwave Frequency Counter HP 1000 Computer Programming Guide
AN-401-7 1979 HP1000-3455A 3455A Digital Voltmeter HP 1000 Computer Programming Guide
AN-401-15 1979 HP1000-8672A 8672A Synthesized Signal Generator HP 1000 Computer Programming Guide
AN-401-16 1979 HP1000-436A 436A Microwave Power Meter HP 1000 Computer Programming Guide
AN-401-17 ? HP1000-8620C 8620C Sweep Oscillator HP 1000 Computer Programming Guide
AN-417-1 1986 9000-S200-S300 HP Basic I/O Concepts for the HP 9000 Series 200 and Series 300
AN-421-1 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Commercial Energy Conservation
AN-421-2 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Fan Testing
AN-421-3 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Vehicle Body Testing
AN-421-4 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Wastewater Treatment
AN-421-5 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Controler Testing
AN-421-6 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Internal Combustion Engine Testing
AN-421-7 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental / Autoclave Testing
AN-421-8 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Communication Cable Testing
AN-421-9 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Residential Facility Testing
AN-421-10 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Canning Process Characterization
AN-421-11 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Explosion Testing
AN-421-12 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Materials Development
AN-421-13 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Plating Line Control
AN-421-14 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Battery Testing
AN-421-15 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pilot Plant Monitoring
AN-421-16 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Jet Engine Testing
AN-421-17 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Facility Management
AN-421-18 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - "Large Product" Characterization
AN-421-19 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Missile System Testing
AN-421-20 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Machine Monitoring Control
AN-421-21 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pharmaceutical Process Control
AN-421-22 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Paper Process Characterisation
AN-421-23 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Rolling Mill
AN-421-24 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Appliance Testing
AN-421-25 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Airframe Testing
AN-421-26 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - On-Road Vehicle Testing
AN-421-27 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Pumping Station Control
AN-421-28 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Receiver Testing
AN-421-29 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Bed-of-Nails Testing for Digital to Analog Converters
AN-421-30 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Automotive Radios and Engine Controllers
AN-421-31 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Sonar System Testing
AN-421-32 1987 3852-S300-1000 Data Aquisition & Computer Aided Test Applications Summary Series - Environmental Test of Electronic Subassemblies
AN-425 1990 4951C-4952A Le Contrôle et l'Entretien de Votre Réseau X,25 (French Translation of AN 425)
AN-426 1989 9000-S300 File Sharing Between HP BASIC/WS, HP BASIC/UX, and HP-UX for HP 9000 Series 300 Computers
AN-907 1967 - The Hot Carrier Diode - Theory, Design and Application
AN-909 1966 - Electrical Isolation Using the HPA 4310
AN-910 1968 - Optoelectronic Coupling for Coding, Multiplexing and Channel Switching
AN-911 ? - Low Level DC Operation Using HP Photochoppers
AN-912 1966 - An Attenuator Design Using PIN Diodes - Constant Impedance Current Controlled 10 MHz to 1,0 GHz Bandwidth
AN-913 1967 - Step Recovery Diode Frequency Multiplier Design
AN-914 1967 - Biasing and Driving Considerations for PIN Diode RF Switches and Modulators
AN-915 1967 - Threshold Detection of Visible and Infrared Radiation with PIN Photodiodes
AN-916 1967 - HPA GaAs Sources
AN-917 1967 - HPA PIN Photodiode
AN-918 1968 - Pulse and Waveform Generation with Step Recovery Diodes
AN-919 1968 - Optmizing Signal-to-Noise Ratio in Photochopper Applications
AN-920 1968 - Harmonic Generation Using Step Recovery Diodes and SRD Modules
AN-921 ? - The 33800 Series Mixer / Detector Module
AN-922 ? - Applications of PIN Diodes
AN-923 ? - Hot Carrier Diode Video Detectors
AN-928 ? - Ku-Band Step Recovery Multiplier
AN-929 ? - Fast Switching PIN Diodes
AN-930 1970 - Handling and Assembling HP Transistor Chips
AN-931 1970 - Solid State Alphanumeric Display - Decoder / Driver Circuitry
AN-932 1974 - Selection and Use of Microwave Diode Switches and Limiters
AN-933 1970 - Monolithic Solid State Seven Segment Displays
AN-935 1971 - Microwave Power Generation and Amplification Using Impatt Diodes
AN-936 1971 - High Performance PIN Attenuator for Low Cost AGC Applications
AN-938 ? - Solid State Lamp Installation Note
AN-942 1973 - Shottky Diodes for High Volume, Low Cost Applications
AN-944-1 1973 - Microwave Transistor Bias Considerations
AN-959-1 1974 - Factors Affecting Silicon IMPATT Diode Reliability and Safe Operation
AN-959-2 1975 - Reliability of Silicon IMPATT Diodes
AN-961 1976 - Silicon Double-Drift IMPATT Diodes for Pulse Application
AN-962 1975 - Silicon Double-Drift IMPATT Diodes for High-Power Microwave Application
AN-963 1980 - Impedance Matching Techniques for Mixers and Detectors
AN-968 1976 - IMPATT Amplifier
AN-991 1984 - Harmonic Mixing with the HSCH-5500 Series Dual Diode
AN-1006 1980 LED-DISPLAY Seven Segment LED Display Applications
AN-1011 1984 - Conception et Mise en Œuvre des Codeurs Incrémentiels HEDS-5000 et HEDS-6000
AN-1025 1985 - Applications and Circuit Design for the HEDS-7000 Series Digital Potentiometer
AN-1034 1988 815X How to Make Accurate Fiber Optic Power Measurements
AN-1200-1 1990 53310A HP 53310A Modulation Domain Analyzer - Simplified Motor Spin-Up Analysis
AN-1200-2 1990 53310A HP 53310A Modulation Domain Analyzer - Direct Characterization of Motion Control Systems
AN-1200-3 1990 53310A HP 53310A Modulation Domain Analyzer - VCO Step Response Analysis Made Easy
AN-1200-4 1990 53310A HP 53310A Modulation Domain Analyzer - Quick Identification of Periodic Jitter Sources
AN-1200-5 1990 53310A HP 53310A Modulation Domain Analyzer - Fast Characterization of Pulse Width Encoded Data
AN-1200-6 1990 53310A HP 53310A Modulation Domain Analyzer - Simple Analysis of Frequency Modulation
AN-1200-7 1990 53310A HP 53310A Modulation Domain Analyzer - Simplified Analysis of Phase-Locked Loop Capture and Tracking Range
AN-1200-8 1990 53310A HP 53310A Modulation Domain Analyzer - Single Shoot Frequency Profiling of Chirped Radars Made Easy
AN-1200-9 1990 53310A HP 53310A Modulation Domain Analyzer - Histograms Simplify Analysis of Random Jitter
AN-1200-10 1990 53310A HP 53310A Modulation Domain Analyzer - Examine Channel Switching Characteristics of Cellular Radios
AN-1200-11 1993 53310A HP 53310A Modulation Domain Analyzer - Examine GMSK Modulation in GSM and PCN Mobile Communications Systems
AN-1200-12 1991 53310A HP 53310A Modulation Domain Analyzer - Peak Deviation and Center Frequency Measurements for CT2 and DECT Radios
AN-1202-1 1990 8751A HP 8751A Network Analyzer 5Hz to 500MHz - Designing Impedance Matching Networks with the HP 8751A
AN-1202-2 1991 8751A HP 8751A Network Analyzer 5Hz to 500MHz - 17 Fixtures, Test Sets and Accessories for the HP 8751A
AN-1202-3 1991 8751A HP 8751A Network Analyzer 5Hz to 500MHz - 3 Steps to Better Baseband, IF and RF Design with the HP 8751A
AN-1205 1991 4142B Efficient Microwave Bias and Test Using the HP 4142B Modular DC Source / Monitor
AN-1206-1 1991 HP Vee Complete Data Acquisition Solutions with HP VEE-Test
AN-1206-2 1991 HP Vee Design Characterization Using HP VEE-Test
AN-1207-1 1991 823XX Multiprocessing with HP Measurement Coprocessors
AN-1207-2 1991 823XX Installing Multiple HP Measurement Coprocessors
AN-1210-1 1991 4194A Characterizing IC Packages with Impedance Measurements and the UTP-3000 Test Fixture
AN-1210-3 1991 813X Simulating Noise Signals for Tolerance Testing
AN-1210-5 1991 54121T Characterizing IC Packages with TDR / TDT and the UTP-3000 Test Fixture
AN-1210-6 1991 5412X-8131A Characterizing Jitter with a Digitizing Oscilloscope
AN-1210-10 1992 54720A-8133A Timing Considerations in Clock Distribution Networks
AN-1210-11 1992 8510-87XX Simulation and Optimization Methods for MCM Substrates
AN-1210-14 1992 4194A-875X Electrical Characterization Methods for MCM Substrates
AN-1210-16 1994 - Characterizing the Performance of High-Speed Digital-to-Analog Converters
AN-1211-1 1991 37722-37732 Standard and CRC-4 Frame Testing
AN-1211-2 1991 377XX Testing N x 64 Kb/s Services
AN-1211-3 1991 377XX Testing Sub-Rate Data Services
AN-1213 1991 3588A-3589A Better Noise Measurements with the HP 3588A & HP 3589A
AN-1214 1991 54510A Sequential Single-Shot Optimizes Speed, Memory Depth and Throughput
AN-1216-1 1992 4142B Performing High-Speed Parameter Extractions on High-Power Devices Using the HP 4142B Modular DC Source / Monitor
AN-1216-2 1992 4142B An Automated DC Parameter Measurement System for Power Modules and Smart Power ICs Using the HP 4142B Modular DC Source / Monitor
AN-1217-1 1992 419X-875X Basics of Measuring the Dielectric Properties of Materials
AN-1218-1 1992 7145X Optical Spectrum Analysis Basics
AN-1219-1 1992 82335B HP 82335B HP-IB for Windows - Utilizing DDE for Test and Measurement Applications
AN-1219-2 1992 82335B HP 82335B HP-IB for Windows - Creating Instrument Control Applications with Visual Basic and HP-IB for Windows
AN-1219-3 1992 82335B HP 82335B HP-IB for Windows - Creating Software Front Panels for Your VXI Instruments
AN-1221 1992 54701A Differential Measurements on Wideband Signals
AN-1223 1992 16550A Logic Analyzer Triggering Applications for the HP 16550A 100 MHz State / 500 MHz Timing Module
AN-1224-1 1992 4338A-4339A Contact Resistance and Insulation Resistance Measurements of Electro-Mechanical Components
AN-1224-2 1992 4339A Insulation Resistance Measurements of the Plate Type Materials
AN-1224-3 1992 4263A Effective Transformers / LF Coils Testing
AN-1224-4 1992 4263A Effective Electrolytic Capacitors Testing
AN-1225-1 1992 16542A Imaging and DSP Testing with the HP 16542A
AN-1225-2 1992 16542A Cache Hit or Miss Analysis with the HP 16542A
AN-1225-3 1992 16542A Digital Video Testing with the HP 16542A
AN-1225-4 1992 16542A Analog-to-Digital Converter Testing with the HP 16542A
AN-1230 1992 35665A Sound Power Measurements
AN-1237-1 1993 - Maximizing Revenue with In-Service Testing-Introduction
AN-1241 1993 54720-1143A Microprobing with the Fine-Pitch Active Probe
AN-1242 1992 - Microprobing Essentials for Fine Pitch Modules
AN-1245 1993 16500X PC Network Connectivity with the HP 16500L Interface Module
AN-1246 1993 6060B Pulsed Characterization of Power Semiconductors Using Electronic Loads
AN-1253 1994 VXI Real-Time System Measures Aircraft Flight Characteristics
AN-1260-1 1993 4396A Combining Network and Spectrum Analysis and IBASIC to Improve Device Characterization and Test Time
AN-1266-1 1994 16500X Intel 80960CA Software Debug Using a Logic Analyzer and an In-Circuit Debugger
AN-1267 1995 71501B-703XX Frequency Agile Jitter Measurement System
AN-1270-1 1995 VXI ++ Final Test and Alignment for Cellular Phones & Failure Analysis and Repair for Cellular Phones
AN-1270-2 1995 VXI ++ VHF Transceiver Testing
AN-1270-3 1995 VXI ++ Prototype Aircraft Jet Engine Characterization and Test
AN-1270-4 1995 VXI ++ Electronic Heater Valves Testing
AN-1270-5 1995 VXI ++ Vehicle Body Testing
AN-1270-6 1995 VXI ++ On Road Vehicle Testing
AN-1270-7 1995 VXI ++ Communication Cable Testing
AN-1270-8 1995 VXI ++ Airframe Testing
AN-1270-9 1995 VXI ++ Jet Engine Controller Testing
AN-1270-10 1995 VXI ++ Jet Engine Testing
AN-1270-11 1995 VXI ++ Environmental Test of Automotive Radios and Engine Controllers
AN-1270-12 1995 VXI ++ Automotive Relay Modules Testing
AN-1272 1996 58503A-59551A GPS and Precision Timing Applications
AN-1273 1995 6840 Compliance Testing to the IEC 1000-3-2 (EN 61000-3-2) and IEC 1000-3-3 (EN 61000-3-3) Standards
AN-1279 1996 5071A-58503A HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications
AN-1279 1998 5071A-58503A HP SmartClock Technology - Improving Oscillator Long-Term Stability for Synchronization Applications
AN-1286-1 1997 856X-859X 8 Astuces pour Améliorer vos Analyses de Spectre (French Translation of AN 1286-1)
AN-1287-1 1997 87XX Understanding the Fundamental Principles of Vector Network Analysis
AN-1287-2 1997 87XX Exploring the Architectures of Network Analyzers
AN-1287-3 1997 87XX Applying Error Correction to Network Analyzer Measurements
AN-1287-4 1997 87XX Network Analyzer Measurements: Filter and Amplifier Examples
AN-1287-7 1998 87XX Improving Network Analyzer Measurements of Frequency-Translating Devices
AN-1288-1 1997 4396B Combining Network and Spectrum Analyses and IBASIC to Improve Device Characterization and Test Time
AN-1288-2 1994 4396B Configuring the HP 4396B for Optical / Electrical Testing
AN-1288-4 1997 4396B How to Characterize CATV Amplifiers Effectively
AN-1289 1997 - The Science of TimeKeeping
AN-1291-1 1997 87XX-8510 8 Hints for Making Better Network Analyzer Measurements
AN-1293 1997 E435X Sequential Shunt Regulation - Regulating Satellite Bus Voltage
AN-1296 1997 - LMDS - The Wireless Interactive Broadband Access Service
AN-1297 1997 42XX-43XX-87XX Solution for Measuring Permittivity and Permeability - Meeting Tomorrow's Material Test Challenges
AN-1298 1997 - Digital Modulation in Communications Systems - An Introduction
AN-1299 1997 37778A-71451B Introduction to BER Testing of WDM Systems
AN-1303 1998 859X-856X Spectrum Analyzer Measurements and Noise - Measuring Noise and Noise-Like Digital Communications Signals with a Spectrum Analyzer
AN-1304-2 1988 54750A-83480A Time Domain Reflectometry Theory
AN-1304-4 2000 54750A Measuring Characteristic Impedance of Short RAMBUS Motherboard Traces and Small-Outline RIMM's
AN-1307 1998 87XX-85XX Testing CDMA Base Station Amplifiers - Measurements Fundamentals of Characterizing the Linear and Non-Linear Behavior of CDMA Amplifiers
AN-1308-1 1998 4395A-4396A Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components
AN-1310 1999 - Mobile Communications Device Testing - Considerations when Selecting a System Power Supply
AN-1313 2000 - Agilent Technologies Wireless Test Solutions - Testing and Troubleshooting Digital RF Communications Transmitter Designs
AN-1316 1999 85XX Optimizing Spectrum Analyzer Amplitude Accuracy
AN-1323 2000 - Internet Advisor - Testing and Troubleshooting Medium and High Speed Frame Relay Networks
AN-1333 1999 - Performing Bluetooth RF Measurements Today
AN-1333 2000 - Agilent - Performing Bluetooth RF Measurements Today
AN-1370-1 2000 HP Vee Data Logging Using Remote Programming
AN-1550-6 1992 8702-8703 High-Speed Lightwave Component Analysis

 

 

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